Tadashi Igarashi1 and Mitsuo Osada1
1R & D Group, Sumitomo Electric Industries, Ltd., Itami
Ag-Cd-Sn alloy wires containing 9.9∼17 mass%Cd and 0.5∼1.5 mass%Sn were oxidized at 873 to 1023 K under an oxygen pressure of 2.1×104 Pa (in air). The depth of the internally oxidized layer, ξ , and an amount of Cd diffused into the oxidized layer from the unoxidized region, JCd, were measured in order to investigate the behavior of solute elements and oxygen during internal oxidation.
The results obtained are as follows:
(1) The relationship between the depth of the internally oxidized layer and the oxidation time was expressed by the following equation:
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