Materials Transactions Online

Materials Transactions, Vol.53 No.04 (2012) pp.617-620
© 2012 The Japanese Society for Non-Destructive Inspection

In-Service Aged Composite Insulators at Transmission Line Investigated by the Micro-Computerized Tomography

Pietro P. J. C. Silva1, Armando H. Shinohara1, Admilson P. Pacheco1, Zurdival P. Castro Filho2 and Sergio L. P. Monteiro2

1UFPE — Federal University of Pernambuco, Department of Mechanical Engineering, Recife-PE, 50740-530, Brazil
2CHESF — Companhia Hidroelétrica do São Francisco, Recife-PE, 50761-901, Brazil

Composite insulators aged in-service for almost 10 years at the transmission line of 230 kV, in an area where brittle fracture of a composite insulator occurred, were inspected by the micro-computed tomography, µ-CT, and by the scanning electron microscope, SEM. As a result, several cracks with different depths under pollutant scale and confined in silicone housing were detected by the µ-CT. Surface of silicone housing was observed by the SEM. Many randomly oriented cracks from micrometers size were observed. However, larger cracks detected and evaluated by the µ-CT appear essentially perpendicular to the composite rod axis. In order to explain the evolution of those large cracks in composite insulators, a model based on µ-CT and SEM data was proposed.

(Received 2009/11/13; Accepted 2011/10/29; Published 2012/03/25)

Keywords: composite insulators, transmission lines of 230 kV, silicone housing, micro-computerized tomography, brittle fracture, scanning electron microscopy

PDF(Free)PDF (Free) Table of ContentsTable of Contents

REFERENCES

  1. E. A. Cherney, R. L. Brown, G. Karady, J. L. Nicholls, T. Orbeck and L. Pargamin: IEEE Trans. PAS (1983) 1226-1234.
  2. Cigre Study Committee 22: Report on Worldwide Experience with HV Composite Insulators, 22-89 (SWG 03-0l) IWD 22, (July 1989).
  3. H. M. Schneider, J. F. Hall, G. Karady and J. Renowden: IEEE Trans. Power Deliv. 1 (1989) 2214-2221.
  4. C. Tourreil, G. Thévenet. E. Brocard. N. Siampiringue and N. Pichon: Proc. the XIVth Int. Symp. on High Voltage Engineering, Tsinghua University, Beijing, China, Aug. (2005).
  5. O. L. S. Paiva and M. Simoes: INMR-World Congress & Exhibition on Insulators, Arresters & Bushings, (2007) pp. 1-9.
  6. A. H. Shinohara, D. M. F. Santana, P. P. J. C. Oliveira, R. J. G. Silva, O. H. Magalhaes, C. G. Silveira, H. J. Khoury, J. F. A. Wavrik, F. M. A. C. Branco, M. A. Leite and T. C. Galindo: DIR 2007 — Int. Symp. on Digital Industrial Radiology and Computed Tomography, (2007), Lyon, France.
  7. N. Chaipanit, C. Rattanakhongviput and R. Sundararajan: Electrical Insulation and Dielectric Phenomena, 2001 Annual Report, Conference on Kitchener, Ont., Canada, 636-639.
  8. A. U. Hamid, K. Y. Soufi and I. A. Hamoudi: J. Mater. Eng. Perform. 17 (2008) 280-286.
  9. F. D. Jestin, N. S. Tomer, R. P. Singh and J. Lacoste: Sci. Technol. Adv. Mater. 9 (2008) 1-6.
  10. A. Krivda, F. Greuter, J. Rocks, X. Kornmann and P. Meier: Annual Report Conference on Electrical Insulation and Dielectric Phenomena, (2006) 389-392.
  11. M. Kumosa, L. Kumosa and D. Armentrout: IEEE Trans. Dielectr. Electr. Insul. 11 (2004) 1037-1048.
  12. Y. Koshino, I. Umeda and M. Ishiwari: Annual Report. Conference on Electrical Insulation and Dielectric Phenomena 1 (1998) 25-28.
  13. Y. Koshino, I. Nakajima and I. Umeda: 30th Symposium on Electrical Insulating Materials, Toyohashi, Japan, (1998) 465-468.
  14. H. Liu, G. Cash, D. Birtwhistle and G. George: IEEE Trans. Dielectr. Electr. Insul. 12 (2005) 478-486.


[JIM HOME] [JOURNAL ARCHIVES]

© 2012 The Japanese Society for Non-Destructive Inspection
Comments to us : editjt@jim.or.jp