Materials Transactions Online

Materials Transactions, JIM, Vol.31 No.7 (1990) pp.615-621
© 1990 The Japan Institute of Metals

Electron Microscopy of Au/Ni Artificial Superlattice Films

H. Dohnomae*, N. Nakayama* and T. Shinjo*

Cross-sections of Au/Ni multilayered films with artificial superstructures have been observed by a transmission electron microscope. Images have revealed alternate coherent stacking of [111] oriented fcc Au and Ni layers. Electron diffraction patterns indicate that films have fiber texture structures. In-plane coherent grain sizes are less than 10 nm. The surface morphology is dependent on the artificial period; films with shorter periods have smoother surfaces. Interface roughness in the range of 3-4 lattice planes causes columnar structures for the multilayered films with longer periods.

(Received February 2, 1990)

Keywords: electron microscopy, multilayered films, artificial superstructure, gold/nickel, epitaxy, interface roughness

* Institute for Chemical Research, Kyoto University, Uji 611, Japan.

Permanent address: Nippon Steel Corporation, 1618 Ida, Nakahara-ku, Kawasaki 211, Japan.

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© 1990 The Japan Institute of Metals