日本金属学会誌

J. Japan Inst. Metals, Vol. 57, No. 1 (1993),
pp. 108-113

Impurity Effect on Cold Roll and Recrystallization Textures of Thin Silicon Steel Sheets

Kazushi Ishiyama1, Ken~Ichi Arai1, Takashi Honda1, Masaki Nakano1, Jirou Harase2 and Nobuyuki Takahashi2

1Research Institute of Electrical Communication, Tohoku University, Sendai
2Electromagnetic Materials, Steel Research Laboratories, Technical Development Bureau, Nippon Steel Corporation, Futtu

Abstract:

Very thin ({<}100 μm) grain oriented silicon steel sheets can be made by using tertiary recrystallization. The tertiary recrystallization behavior is changed by the contents of impurities. in this study, the purity dependence of cold rolled and recrystallized texture was observed. The main findings were as follows;
(1) The texture of cold rolling was strong {111}< 112> and weak (100)[011]. The primary recrystallized texture was very strong (110)[001]. These textures were independent of the contents of impurities. In the low-purity samples, the primary grains grow up with increasing annealing temperature. On the other hand, the growth of primary grains was not observed in the high-purity samples.

(2) Secondary recrystallization behavior depended on the purity of the samples. In the low-purity samples, the secondary recrystallization began at 1073 K. The main texture of secondary recrystallized grains was (410)-(430)[001]. A weak (110)[001] texture was also observed. In the high-purity samples, the temperature of beginning of secondary recrystallization was higher than that of the low-purity samples. The main texture of secondary recrystallized grains of the high-purity samples was {111}< 112>. In the high-purity samples the amount of (110)[001] grains in the secondary recrystallized grains as the seeds of tertiary recrystallization was larger than that of the low-purity samples.


(Received March 4, 1992)

Keywords:

grain oriented silicon steel, impurity, tertiary recrystallization, surface energy


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