日本金属学会誌

J. Japan Inst. Metals, Vol. 52, No. 3 (1988),
pp. 336-342

Structure of Anodic oxide Films Formed on Rapidly Quenched Al-Ti Alloys

Masataka Masuda1, Yoshikazu Tanaka1, Yasuhiro Watanabe1, Susumu Nanao1 and Takashi Mochizuki2

1Insitute of Industrial Science, University of Tokyo, Tokyo
2Nichicon Capacitor Ltd., Nagano

Abstract:

Rapidly Quenched aluminum-titanium alloys provide excellent characteristics as electrodes for electrolytic capacitors, since anodic oxide films formed on them have large dielectric constants and high breakdown voltages. Structure of the oxide films was analyzed by the use of TEM, EDX and X-ray diffraction techniques. The results obtained are as follows; (1) The structure of anodic oxide films is always amorphous. (2) Boiling water pre-treatment produces fibrous structure on the film surface. (3) The thickness of oxide per unit formation voltage is 1.3--1.4 nm/V. (4) Titanium rich petal-like oxide flakes exist in the oxide, and this is the cause of the excellent properties of this new electrode material.


(Received 1987/8/20)

Keywords:

rapidly quenching, aluminum titanium alloy, anodic oxide film, capacitor material, structure observation


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