Materials Transactions Online

Materials Transactions, JIM, Vol.31 No.7 (1990)

513-522 :
Refraction of Electron Rays by Atom and Ray Trajectories in Crystal
Sigemaro Nagakura
523-537 :
Usefulness and Applications of Electron Microscopy to Materials Science
Hiroshi Fujita
538-544 :
Analytical Transmission Electron Microscopy in Materials Science
Y. Bando
545-550 :
Characterization of Ceramics-Metal Joined Interfaces by HREM
Yoichi Ishida
551-560 :
Applications of Electron Holography to Materials Science
Junji Endo and Akira Tonomura
561-566 :
Low Temperature Observation of Superconducting Materials with a Superconducting Cryo-Electron Microscope
Masashi Iwatsuki and Yoshiyasu Harada
567-572 :
High-Resolution Electron Microscopy and Atomic Arrangements of Al-Mn-Si and Al-Li-Cu Icosahedral Quasicrystals
Kenji Hiraga and Daisuke Shindo
573-581 :
High Resolution Electron Microscope Observation of Medium Range Atomic Ordering in an Amorphous Pd-Si Alloy
Yoshihiko Hirotsu, Kazunori Anazawa and Tadakatsu Okubo
582-587 :
Stacking Disorders and Twin Deformation in Small Metal Clusters
Sumio Iijima and Toshinari Ichihashi
588-594 :
Structures and Physical Properties of Metal-MgO Single Crystalline Composite Films
Nobuo Tanaka, Kouji Kimoto, Fukio Yoshizaki
and Kazuhiro Mihama
595-601 :
High-Resolution Transmission Electron Microscopy of Superconducting and Non-Superconducting Phases in a Bi-Sr-Cu-O System
Yoshio Matsui, Shunji Takekawa, Kohji Kishio, Akihiro Umezono,
Sachiko Nakamura, Chusei Tsuruta and Katsuhiko Ibe
602-607 :
Cross-Sectional High-Resolution Transmission Electron Microscope Studies of Superconducting Oxide Thin Films of the Bi-System
Shozo Ikeda, Junichi Sato and Keikichi Nakamura
608-614 :
Modulated Structures in Bi-Sr-Ca-Cu-O and Bi-Sr-Cu-O Compounds
Daniel R. Dietderich, Kazumasa Togano, Hiroshi Maeda,
Shozo Ikeda, Yoshio Matsui and Hiromi Mukaida
615-621 :
Electron Microscopy of Au/Ni Artificial Superlattice Films
H. Dohnomae, N. Nakayama and T. Shinjo
622-627 :
Atomic Structure of Heteroepitaxial Interface between II-VI and III-V Semiconductor
N. Otsuka, D. Li, J. Qiu,
M. Kobayashi and R. L. Gunshor
628-635 :
Study of Interfacial Reactions in Metal-Silicon and Related Systems by High-Resolution Electron Microscopy and Thermodynamic Analysis
R. Sinclair
636-640 :
Electron Microscopy Study of the Charge-Density-Wave Transition in 2H-TaSe2
Y. Koyama and T. Onozuka
641-646 :
Convergent-Beam Electron Diffraction for Local Lattice Parameters in III-V Semiconductors
Y. Tomokiyo, T. Okuyama, S. Matsumura,
N. Kuwano and K. Oki
647-651 :
Electron Channelling Enhanced Microanalysis on Ni-Al-Mn and Al-Mn-Si
Daisuke Shindo, Kenji Hiraga, Takayuki Takasugi
and An-Pang Tsai
652-658 :
Site Determination of Ni Atoms in Cu-Al-Ni Shape Memory Alloys by Electron Channelling Enhanced Microanalysis
Yoshiyuki Nakata, Tsugio Tadaki and Ken'ichi Shimizu
659-665 :
Characterization of Crystal Defects by Cathodoluminescence Detection System Combined with TEM
N. Yamamoto

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